Differential spr sensor and measuring method using it
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United States of America Patent
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Issued Date -
Jun 19, 2003
app pub date -
Nov 21, 2002
filing date -
May 25, 2000
priority date (Note) -
Abandoned
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Abstract
The present invention provides a differential SPR sensor that is capable of independently determining resonance wavelenghts without determining a baseline. A differential SPR sensor is formed with a surface immobilized with a recognition component and a surface not immobilized with the component on a metal film. The sensor comprises a plurality of dielectric films of different film thicknesses formed on the metal film, wherein one of said dielectric films is taken to be a reference surface and at least the other one dielectric film is taken to be a working surface immobilized with the recognition component. Preferably, the sensor is a probe-type SPR sensor, and a working surface and a reference surface are formed on a metal film providing a sensor surface of the probe.
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