Digital FTIR spectrometer
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United States of America Patent
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N/A
Issued Date -
Jun 5, 2003
app pub date -
Nov 25, 2002
filing date -
Dec 5, 2001
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
The present invention relates to an FTIR spectrometer comprising a single-element detector to analyze a detector light beam emitted by a sample, with a unit to digitize the voltage available at the detector output and with a unit to process the digitized voltage. The single-element detector and the dedicated unit to digitize the detector voltage are located immediately adjacent to each other.
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