Imaging FTIR spectrometer
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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N/A
Issued Date -
Jun 5, 2003
app pub date -
Nov 25, 2002
filing date -
Dec 5, 2001
priority date (Note) -
Abandoned
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Abstract
The present invention relates to an imaging FTIR spectrometer comprising a housing with an integrated interferometer, sample and detector. The light of the source first passes through the interferometer, then it is focused on the sample which is imaged on the surface of a detector array. The present invention also provides an FTIR spectrometer with a detector array and ADCs integrated on the detector array chip such that each pixel has an individual dedicated ADC.
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