Optical module testing method and testing system
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United States of America Patent
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N/A
Issued Date -
May 1, 2003
app pub date -
Apr 2, 2002
filing date -
Nov 1, 2001
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
While modules to be tested in one constant temperature oven are tested by providing a plurality of constant temperature ovens, accommodating a plurality of modules to be tested in each constant temperature oven and connecting the modules to be tested accommodated in a plurality of constant temperature ovens to the measuring instruments via the switches, preparation for testing such as temperature change of the other constant temperature oven is conducted and the modules to be tested in one constant temperature oven are tested using measuring instruments. Thereafter, the switches are changed over and the modules to be tested accommodated in the other constant temperature oven are tested. Thereby, expensive measuring instruments can be used effectively.
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