Processing line having means to monitor crystallographic orientation
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United States of America Patent
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N/A
Issued Date -
Jan 30, 2003
app pub date -
Jul 15, 2002
filing date -
Feb 9, 2000
priority date (Note) -
Abandoned
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Abstract
Apparatus for continuously moving a substrate and coating the substrate with a crystalline coating has at least one means for monitoring the crystalline orientation of the coating, either continuously or periodically.
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