Device for quantitative assessment of the aligned position of two machine parts, workpieces or the like
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
Jan 23, 2003
app pub date -
Sep 25, 2002
filing date -
Mar 22, 2001
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
A device for quantitative assessment of the aligned position of two machine parts, workpieces or the like is used especially for purposes of axis alignment or spindle alignment. A light beam is incident on an optoelectronic sensor which can be read out two-dimensionally and the impact point there is determined by the sensor. Part of the light beam is preferably reflected by the sensor directly onto a second optoelectronic sensor. The impact point of the reflected light beam there is determined in a feasible manner by the second sensor. The orientation of at least the first sensor relative the location of the light beam is determined from the signals of the two sensors.
First Claim
Other Claims data not available
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
- 1 Citation Count
- G01B Class
- 4.57 % this patent is cited more than
- 22 Age