Optical system for detecting surface defects and disk tester and disk testing method utilizing the same optical system

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United States of America Patent

APP PUB NO 20020180959A1
SERIAL NO

10152838

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Abstract

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A defect detecting optical system includes a light receiving optical system including an objective lens provided above the surface of the disk in parallel to the surface for receiving the scattered light and focusing an image of a test region of the disk on the light sensor through the objective lens and a plurality (n) of light illuminating systems provided around the objective lens equiangularly in a plane parallel to the disk with an angular interval of substantially 360.degree./n and emitting light beams to the test region with elevation angles in a range from 55.degree. to 60.degree. measured from the surface of the disk, where n is an integer equal to or larger than 3.

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Patent Owner(s)

Patent OwnerAddress
HITACHI ELECTRONICS ENGINEERING CO LTDSHIBUYA-KU TOKYO 150

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ishiguro, Takayuki Tokyo, JP 31 313
Nakajima, Hiroshi Tokyo, JP 280 3141

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