MOS field effect transistor structure and method of manufacture

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United States of America Patent

SERIAL NO

10085666

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Abstract

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A method of manufacturing a metal-oxide-semiconductor field effect (MOSFET) device. A substrate having an isolating structure thereon is provided. A gate dielectric layer and a conductive layer are sequentially formed over the substrate. The conductive layer and the gate dielectric layer are patterned to form a gate structure. A low dielectric constant material spacer is formed on the sidewall of the gate structure. A source drain region is formed in the substrate on each side of the gate structure.

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Patent Owner(s)

Patent OwnerAddress
CHENG SHUI-MINGNot Provided

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cheng, Shui-Ming Hsinchu Hsien, TW 24 545
Cheng, Yao-Chin Hsinchu, TW 14 193
Huang, Yu-Shyang Taipei Hsien, TW 5 45
Liu, Chih-Chien Taipei, TW 152 2107

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