Compact surface quality meter
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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N/A
Issued Date -
Nov 21, 2002
app pub date -
May 20, 2002
filing date -
May 21, 2001
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
An apparatus for measuring the visual characteristics of the surface of a workpiece includes a light source which produces a beam of light. One or more mirrors are positioned so as to direct the light from the source onto the workpiece for reflection therefrom, and to direct the reflected beam onto a photodetector. At least one of the mirrors is supported on a movable mirror carriage which is coupled to a member which contacts the workpiece surface and adjusts the position of the mirror or mirrors supported by the carriage so as to assure that the reflected beam falls on the photodetector. The detector may be mechanically scanned across the reflected beam to provide a spatial profile of that beam.
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