Error detection apparatus and method for use with engravers
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United States of America Patent
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N/A
Issued Date -
N/A
app pub date -
Feb 7, 2001
filing date -
Feb 25, 1993
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
An error detection apparatus and method for use with engravers, such as gravure engravers. An error value E corresponding to the difference between a set of predetermined setup parameters and actual measurement of a portion of an engraved area on the cylinder is determined. The error value E is then used to adjust the engraver to engrave an actual cut or etch in accordance with the set of predetermined setup parameters. The error detection and correction system is suitable for providing a closed-loop system for engraving a cylinder. The apparatus and method may be used during initial setup or during normal operation of the engraver. A method is disclosed comprising the steps of engraving ink receptive cells in the surface of a rotating gravure printing cylinder consisting of the steps of generating a cell width command signal comprising a series of cell width commands, engraving the cells by using the cell width command signal to urge an engraving stylus into periodic engraving contact with the surface, measuring actual widths of cells which have been engraved as aforesaid, and adjusting the cell width command signal in correspondence with differences between the actual widths and the cell width commands. In another embodiment of the invention, an improved measuring system and method for measuring an engraved area is provided, the improved system and method utilize a system and method for automatically or self-calibrating an image system to provide accurate measurements of engraved areas imaged. The system and method determine a calibration factor which is utilized by a processor which is applied to a pixel span associated with an imaged engraved area to provide a measurement of a dimension of the engraved area. The calibration factor is determined using a ratio of a pixel span between imaged engraved areas to a known distance between the engraved areas which, in turn, provides a dimension for a pixel in real units, such as microns. The calibration factor obtained may then be applied to pixel representations of engraved areas to provide actual measurements.

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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
MDC MAX DAETWYLER AG | FLUG PLATZ CH-3368 BLEIENBACH-LANGENTHAL |
International Classification(s)

- [Classification Symbol]
- [Patents Count]
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Flannery, David L | Dayton, OH | 3 | 15 |
Seitz, David R | Dayton, OH | 34 | 302 |
Staub, Thomas P | Dayton, OH | 3 | 11 |
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Maintenance Fees
Fee | Large entity fee | small entity fee | micro entity fee | due date |
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Fee | Large entity fee | small entity fee | micro entity fee |
---|---|---|---|
Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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