Analysis of materials containing radioactive sources
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United States of America Patent
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Issued Date -
Sep 12, 2002
app pub date -
Feb 28, 2002
filing date -
Nov 17, 1998
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Abandoned
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Abstract
The invention provides a technique for correcting gamma ray intensities detected to account for variation in attenuation effects with energy. The corrected intensity values enable more accurate isotopic analysis to be conducted and render such techniques applicable to low level emission cases. The technique is particularly useful in investigate waste materials with a gamma emitting content which needs to be determined. The attenuation is corrected for using a bi- modal function to account for the attenuation effects arising from low and high atomic mass components of the material in which the emitters are present.
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