Interferometric measuring arrangement for superimposing at least two lightwaves
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United States of America Patent
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Issued Date -
Sep 5, 2002
app pub date -
Jul 20, 2001
filing date -
Jul 21, 2000
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
It is the case of an interferometric measuring arrangement for superimposing at least two light waves, with a first coupling means for coupling the light waves coming from a light source into a sample arm and into a reference arm, and with a second coupling means for superimposing the light waves coming from the reference arm and the sample arm, which are led to at least one detector. The light waves at least within the reference arm are exclusively led in at least one fiber guide which they do not leave on their path between the coupling means, and with which the sample arm extends on both sides of the first coupling means.
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