Method, arrangement, and system for ascertaining process variables

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United States of America Patent

APP PUB NO 20020085763A1
SERIAL NO

10023490

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Abstract

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The invention discloses a method, an arrangement, and a system for ascertaining process variables. The method is characterized by multiple steps. The intensities ascertained by a plurality of detectors from different spectral regions of a measurement operation are combined into one intensity vector ({overscore (I)}). A norm of the intensity vector ({overscore (I)}) is calculated therefrom. Those intensity vectors whose norm is less than a definable threshold value (SW) are then discarded. The intensity vectors ({overscore (I)}) are normalized. Processing of the intensity vectors ({overscore (I)}) is accomplished in a vector quantizer (58). Lastly, code book vectors are read out of the vector quantizer (58).

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Patent Owner(s)

Patent OwnerAddress
LEICA MICROSYSTEMS HEIDELBERG GMBHIM NEUENHEIMER FELD 518 HEIDELBERG D-691

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Olschewski, Frank Heidelberg, DE 25 207

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