Semiconductor integrated circuit and test method of built-in analog circuit
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United States of America Patent
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Issued Date -
Feb 28, 2002
app pub date -
Feb 9, 2001
filing date -
Aug 25, 2000
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
Conventional semiconductor integrated circuits have a problem that a test of an analog circuit requires considerable labor and cost. However, an address decoder for decoding an address input from the outside and generating an address signal, a storing unit for storing data for setting a parameter input from the outside in a location indicated by the address signal, and a selector for selecting data stored in the storing means instead of a signal value on a control bus at the time of testing an analog circuit are provided in a semiconductor integrated circuit, thereby allowing reductions in labor and costs.
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