Defect detection method and apparatus, and computer-readable storage medium

Number of patents in Portfolio can not be more than 2000

United States of America

PATENT NO 12266091
APP PUB NO 20240070840A1
SERIAL NO

18356232

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Abstract

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Provided are a defect detection method and apparatus, and a computer-readable storage medium. Specifically, the method includes: obtaining a to-be-detected image; obtaining a feature map of the to-be-detected image based on the to-be-detected image, where the feature map of the to-be-detected image includes a feature map of spatial position coordinate information; and performing defect detection on the to-be-detected image based on the feature map of the to-be-detected image. By modifying a neural network structure of defect detection and extracting the feature map of spatial position coordinate information during the detection, this application makes the neural network for use of defect detection sensitive to a spatial position, thereby enhancing sensitivity of a detection neural network to the spatial position, and in turn, increasing accuracy of detecting some specific defect types by the detection neural network, and increasing accuracy of defect detection.

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Patent Owner(s)

Patent OwnerAddress
CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITEDLEVEL 19 CHINA BUILDING 29 QUEEN'S ROAD CENTRAL CENTRAL CENTRAL AND WESTERN DISTRICT HONG KONG

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Jiang, Guannan Ningde, CN 31 4
Wang, Xi Ningde, CN 356 3114
Wang, Zhiyu Ningde, CN 59 216

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