Method and system for thermal control of devices in electronics tester
Number of patents in Portfolio can not be more than 2000
United States of America
Stats
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Apr 1, 2025
Grant Date -
Dec 26, 2024
app pub date -
Sep 5, 2024
filing date -
Sep 5, 2024
priority date (Note) -
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status (Latency Note)
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Abstract
A tester apparatus is provided. Slot assemblies are removably mounted to a frame. Each slot assembly allows for individual heating and temperature control of a respective cartridge that is inserted into the slot assembly. A closed loop air path is defined by the frame and a heater and cooler are located in the closed loop air path to cool or heat the cartridge with air. Individual cartridges can be inserted or be removed while other cartridges are in various stages of being tested or in various stages of temperature ramps.
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