Type of device(s) for automatically monitoring a coating and/or structure applied to a substrate with determination of reflective properties and/or geometric dimensions, and a corresponding method
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United States of America
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Apr 1, 2025
Grant Date -
Nov 2, 2023
app pub date -
Mar 25, 2021
filing date -
Mar 25, 2021
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Abstract
A material application and analysis device may comprise at least one analysis device for optically monitoring at least a first material application and a second material application, and a material application element for applying the second material application to a substrate provided with the first material application at least in sections. The material application element is arranged between a first radiation source and detection device assembly and a second radiation source and detection device assembly, wherein by the first radiation source and detection device assembly the first material application is detectable and wherein by the second radiation source and detection device assembly the second material application is detectable. Furthermore, first image data are processed and second image data are processed, and the processed first image data are evaluated with respect to a physical parameter and the processed second image data are evaluated with respect to a geometrical parameter.
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