Contact probe for probe heads of electronic devices
Number of patents in Portfolio can not be more than 2000
United States of America
Stats
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Mar 25, 2025
Grant Date -
Oct 5, 2023
app pub date -
Aug 3, 2021
filing date -
Aug 3, 2021
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A contact probe having a first end portion adapted to abut onto a contact pad of a device under test and a second end portion adapted to abut onto a contact pad of a PCB board of a testing apparatus, as well as a rod-shaped probe body extended between the end portions along a longitudinal development direction is provided with an opening extending along the longitudinal development direction and defines at least one pair of arms in the probe body. Suitably, each arm of the at least one pair of arms has a not constant transversal section, which is perpendicular to the longitudinal development direction, having different areas in correspondence of different points along the probe body and ensures a distribution of the stress along the probe body during bending thereof during testing operation of the device under test performed by means of the contact probe.
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