Testing device and testing method for detecting stitching defect of panoramic camera

Number of patents in Portfolio can not be more than 2000

United States of America

PATENT NO 12250364
APP PUB NO 20230164306A1
SERIAL NO

17577000

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Abstract

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A testing device and a testing method for detecting a stitching defect of a panoramic camera are provided. The testing method includes: accessing the panoramic camera to obtain a stitched image, wherein the stitched image includes a chart image corresponding to a chart, wherein the chart includes multiple black stripes and multiple white stripes; generating a defect image marked with the stitching defect according to the chart image; and outputting the defect image.

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Patent Owner(s)

  • ASPEED TECHNOLOGY INC.

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Liao, Chieh-Cheng Hsinchu, TW 3 3

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