Multigate device structure with engineered cladding and method making the same

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United States of America

PATENT NO 12249539
APP PUB NO 20230178418A1
SERIAL NO

17805715

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Abstract

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The present disclosure provides a method of making a semiconductor device. The method includes forming a semiconductor stack on a substrate, wherein the semiconductor stack includes first semiconductor layers of a first semiconductor material and second semiconductor layers of a second semiconductor material alternatively stacked on the substrate; patterning the semiconductor stack and the substrate to form a trench and an active region being adjacent the trench; epitaxially growing a liner of the first semiconductor material on sidewalls of the trench and sidewalls of the active region; forming an isolation feature in the trench; performing a rapid thermal nitridation process, thereby converting the liner into a silicon nitride layer; and forming a cladding layer of the second semiconductor material over the silicon nitride layer.

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Patent Owner(s)

  • TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Chien-Hung Hsinchu, TW 395 1635
Kuo, Jiun-Ming Taipei, TW 58 64
Lin, Jheng-Wei Hsinchu, TW 2 0
Peng, Yuan-Ching Hsinchu, TW 76 280
Shen, Shu-Wen Hsinchu, TW 10 2
Yang, Ji-Xuan Tainan, TW 1 0

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