Integrated circuit defect diagnosis using machine learning

Number of patents in Portfolio can not be more than 2000

United States of America

PATENT NO 12248859
APP PUB NO 20210042644A1
SERIAL NO

16986963

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Abstract

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A three-phase diagnosis methodology capable of effectively diagnosing and classifying multiple defects in integrated circuits comprises a first phase identifying a defect that resembles traditional fault models, and second and third phases that utilize the X-fault model and machine learning to identify correct candidates.

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Patent Owner(s)

  • CARNEGIE MELLON UNIVERSITY

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Blanton, Ronald D Pittsburgh, US 3 6
Mittal, Soumya Pittsburgh, US 1 2

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