Impedance measurement system
Number of patents in Portfolio can not be more than 2000
United States of America
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Mar 11, 2025
Grant Date -
Mar 9, 2023
app pub date -
Jul 21, 2022
filing date -
Jul 21, 2022
priority date (Note) -
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status (Latency Note)
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Abstract
An impedance measurement system configured to measure impedance of a measurement target capable of supplying power to an electrical load device includes one or more processors and one or more memories. The one or more processors are configured to perform a process including: acquiring data about output power from the measurement target when an alternating current signal of at least one frequency is superimposed on the output power; calculating impedance at the at least one frequency with data about an exclusion period when waveform distortion of the output power is detected being excluded; and in a case where how many times the data about the exclusion period is excluded at a certain frequency is greater than or equal to a predetermined threshold value, changing of a setting of an operating condition of an electronic device coupled to the measurement target or the electrical load device.
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