Diode test module for monitoring leakage current and its method thereof

Number of patents in Portfolio can not be more than 2000

United States of America

PATENT NO 12248019
APP PUB NO 20230168298A1
SERIAL NO

17536513

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Abstract

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A diode test module and method applicable to the diode test module are provided. A substrate having first conductivity type and an epitaxial layer having second conductivity type on the substrate are formed. A well region having first conductivity type is formed in the epitaxial layer. A first and second heavily doped region having second conductivity type are theoretically formed in the well and connected to a first and second I/O terminal, respectively. Isolation trench is formed there in between for electrical isolation. A monitor cell comprising a third and fourth heavily doped region is provided in a current conduction path between the first and second I/O terminal when inputting an operation voltage. By employing the monitor cell, the invention achieves to determine if the well region is missing by measuring whether a leakage current is generated without additional testing equipment and time for conventional capacitance measurements.

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Patent Owner(s)

  • AMAZING MICROELECTRONIC CORP.

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chuang, Che-Hao Hsinchu County, TW 51 322
Huang, Sung Chih Yilan County, TW 1 0
Lin, Kun-Hsien Hsinchu, TW 74 426
Yeh, Chih-Ting Hsinchu County, TW 18 61

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