Method of manufacturing integrated circuit

Number of patents in Portfolio can not be more than 2000

United States of America

PATENT NO 12243822
APP PUB NO 20230387014A1
SERIAL NO

18447572

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Importance

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Abstract

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A method includes forming a first transistor stack over a substrate. The first transistor stack includes: a first transistor of a first conductivity type, and a second transistor of a second conductivity type different from the first conductivity type. The second transistor is above the first transistor. A plurality of first conductive lines is formed in a first metal layer above the first transistor stack. The plurality of first conductive lines includes, over the first transistor stack, a power conductive line configured to route power to the first transistor stack, one or more signal conductive lines configured to route one or more signals to the first transistor stack, and a shielding conductive line configured to shield the routed one or more signals. The one or more signal conductive lines are between the power conductive line and the shielding conductive line.

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Patent Owner(s)

  • TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Chih-Liang Hsinchu, TW 301 1501
Lai, Chih-Yu Hsinchu, TW 60 304
Tien, Li-Chun Hsinchu, TW 276 2262
Zhuang, Hui-Zhong Hsinchu, TW 306 953

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