Socketless or flush mount QFN (quad flat no lead) test board, fixture, and method
Number of patents in Portfolio can not be more than 2000
United States of America
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Mar 4, 2025
Grant Date -
May 4, 2023
app pub date -
Oct 21, 2022
filing date -
Oct 21, 2022
priority date (Note) -
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status (Latency Note)
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Abstract
An apparatus comprises a toggle member, a plurality of pogo pins, and a test board in operable communication with the toggle member. The pogo pins are coupled to the toggle member to move along a first axis when the toggle member moves along the first axis. Each pogo pin includes a plunger that moves within the pogo pin along the first axis. The pogo pins and respective plungers contact a top surface of the DUT when the DUT is coupled to the test board and positioned so that a conductor on its outer surface is aligns to and contacts a conductive region of the test board. Movement of the toggle member along the first axis translates to the plungers, applying a pressure sufficient to the top surface of the DUT to ensure flushmount electrical contact between the conductor of the DUT and the conductive region.
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