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United States of America

PATENT NO 12237236
APP PUB NO 20230260856A1
SERIAL NO

18005418

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ATTORNEY / AGENT: (SPONSORED)

Importance

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Abstract

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The present invention relates to the inspection process which includes providing access to the microdevice contacts, measuring the microdevice and analyzing the data to identify defects or performance of the micro device. The invention also relates to the forming of test electrodes on microdevices. The test electrodes may be connected to hidden contacts. The type of microdevices may be vertical, lateral or a flip chip.

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First Claim

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Patent Owner(s)

  • VUEREAL INC.

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chaji, Gholamreza Waterloo, CA 430 4287
Fathi, Ehsanollah Waterloo, CA 75 112
Hwang, David Waterloo, CA 55 497
Siboni, Hossein Zamani Waterloo, CA 24 35

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Maintenance Fees

Fee Large entity fee small entity fee micro entity fee due date
3.5 Year Payment $1600.00 $800.00 $400.00 Aug 25, 2028
7.5 Year Payment $3600.00 $1800.00 $900.00 Aug 25, 2032
11.5 Year Payment $7400.00 $3700.00 $1850.00 Aug 25, 2036
Fee Large entity fee small entity fee micro entity fee
Surcharge - 3.5 year - Late payment within 6 months $160.00 $80.00 $40.00
Surcharge - 7.5 year - Late payment within 6 months $160.00 $80.00 $40.00
Surcharge - 11.5 year - Late payment within 6 months $160.00 $80.00 $40.00
Surcharge after expiration - Late payment is unavoidable $700.00 $350.00 $175.00
Surcharge after expiration - Late payment is unintentional $1,640.00 $820.00 $410.00