Memory test method, memory test apparatus, memory test device, and storage medium

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United States of America

PATENT NO 12237036
APP PUB NO 20240021265A1
SERIAL NO

17607242

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Abstract

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A memory test method includes: obtaining a preset memory and a memory to be tested; setting the memory to be tested as a reserved memory; starting an operating system, wherein the operating system runs in the preset memory; and executing a memory test program to test the memory to be tested, wherein the memory test program runs in the preset memory.

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Patent Owner(s)

Patent OwnerAddress
CHANGXIN MEMORY TECHNOLOGIES INCHEFEI ANHUI 230000

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Li, Xiaolei Hefei, CN 44 234

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