Method of forming semiconductor structure and semiconductor structure

Number of patents in Portfolio can not be more than 2000

United States of America

PATENT NO 12232310
APP PUB NO 20230043941A1
SERIAL NO

17647622

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Abstract

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The present disclosure provides a method of forming a semiconductor structure and a semiconductor structure. The method of forming a semiconductor structure includes: providing an initial structure, where the initial structure includes a substrate and bit line structures arranged at intervals on the substrate; forming an initial protective structure, where the initial protective structure at least covers a part of sidewalls of each of the bit line structures, and the initial protective structure has a first height in a direction parallel to the bit line structures; forming a shielding structure, where the shielding structure at least covers a part of sidewalls of the initial protective structure; and removing at least a part of the initial protective structure exposed by the shielding structure by using the shielding structure as an etching selection layer, to form protective structures each having a second height.

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Patent Owner(s)

  • CHANGXIN MEMORY TECHNOLOGIES, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Wu, Gongyi Hefei, CN 26 8
Yang, Peng Hefei, CN 169 590

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