System and method of measuring capacitance of device-under-test

Number of patents in Portfolio can not be more than 2000

United States of America

PATENT NO 12228598
APP PUB NO 20240027504A1
SERIAL NO

17813633

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Abstract

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The present disclosure provides a system of measuring capacitance of a device-under-test (DUT). The system includes first switch, second switch, and a capacitance measurement device. The first switch is configured to receive a supply voltage. The first and second switches are electrically connected to the DUT. The capacitance measurement device is configured to provide a first pair of non-overlapping periodic signals with a first frequency, and a second pair of non-overlapping periodic signals with a second frequency. The second frequency is β times the first frequency. When the first switch and the second switch receive the first pair of non-overlapping periodic signals, a first current is transmitted through the first switch and the second switch. When the first switch and the second switch receive the second pair of non-overlapping periodic signals, a second current is transmitted through the first switch and the second switch.

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Patent Owner(s)

  • TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chang, Chih-Hsien New Taipei, TW 152 371
Chou, Mao-Hsuan Hsinchu County, TW 26 104
Sheen, Ruey-Bin Taichung, TW 91 221

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