Broad ion beam (BIB) systems for more efficient processing of multiple samples
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United States of America
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Feb 18, 2025
Grant Date -
Nov 23, 2023
app pub date -
May 19, 2022
filing date -
May 19, 2022
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Abstract
Systems and methods for operating a broad ion beam (BIB) polisher in a sample preparation workflow having improved uptime, are disclosed. An example method for operating a broad ion beam (BIB) polisher having improved uptime according to the present invention comprises causing a first BIB source to emit a first broad ion beam towards a sample positioned within an interior volume of the BIB polisher while the first BIB source is in emitting the first broad ion beam towards the sample, removing a second BIB source from the BIB polisher that is configured to emit a second broad ion beam towards the sample when in use.
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