Deep learning-based MLCC stacked alignment inspection system and method
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United States of America
Stats
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Jan 28, 2025
Grant Date -
Mar 28, 2024
app pub date -
Nov 1, 2022
filing date -
Nov 1, 2022
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A deep learning-based MLCC stacked alignment inspection system includes an integrated defect detection unit configured to detect core areas requiring inspection of image data in which a stacked structure is photographed from a semiconductor MLCC chip by using at least one deep learning-based core area detection model, perform segmentation in the detected core areas, determine whether a defect exists according to a standard margin percentage range, and enable defect detection by generating normal and/or defective data based on the determination result, a result analysis unit configured to perform visualization for respective results of the core area detection, segmentation, and defect detection of the integrated defect detection unit, and provide stepwise analysis data for the visualized respective results so as to determine whether to modify corresponding data, and a data storage configured to store the normal and/or defective data, and stepwise analysis data.
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International Classification(s)
- 2022 Application Filing Year
- G06N Class
- 11536 Applications Filed
- 3514 Patents Issued To-Date
- 30.47 % Issued To-Date
Cited Art Landscape
Patent Citation Ranking
- 0 Citation Count
- G06N Class
- 0 % this patent is cited more than
- < 1 Age
Maintenance Fees
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