Shared data induced quality control for a chemical mechanical planarization process

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United States of America

PATENT NO 12205061
APP PUB NO 20230325751A1
SERIAL NO

17663899

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Abstract

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A method for developing or improving a process for producing a product from a material comprising steps of acquiring the composition for at least two slurries as raw material data (17) for the CMP based manufacturing process and its relevant parameters (2) by using a Data Collecting computer (9); physically performing specific method steps of a CMP process; measuring relevant parameters of the used slurries and the physically performed CMP process to determine the CMP process performance by using the Data Collecting computer (9); analyzing the measured data about the relevant parameters with a specific software performed on an Analyzing computer (11) by creating for the software and applying with it a predictive model using Machine Learning to understand the intercorrelation of the different parameters and using the results to improve the CMP process performance and the resulting product quality of the CMP based manufacturing process.

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Patent Owner(s)

Patent OwnerAddress
VERSUM MATERIALS US LLC8555 SOUTH RIVER PARKWAY TEMPE AS 85284-3112

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Clarke, Ryan San Jose, US 15 37
Clavero, Cesar Half Moon Bay, US 27 57
Gan, Lu Chandler, US 90 328
Gopal, Vid Sunnyvale, US 1 0
Lin, Shirley Hsinchu, TW 5 33
Mallikarjunan, Anupama Shihlin District, TW 27 2569
Murella, Krishna Phoenix, US 4 14
Pham, Hieu Santa Clara, US 28 289
Rose, Joseph Gilbert, US 12 36
Yang, Rung-Je Hsinchu, TW 9 8
Yitamben, Esmeralda Milpitas, US 1 0
Zhou, Hongjun Chandler, US 102 128

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