Shielded socket and carrier for high-volume test of semiconductor devices

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United States of America Patent

PATENT NO 12203958
APP PUB NO 20240027492A1
SERIAL NO

18479030

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Abstract

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A test apparatus comprising a tester interface board (TIB) affixed in a slot of a tester rack, wherein the TIB comprises test circuitry and a plurality of sockets, each socket operable to receive a device under test (DUT). The test apparatus further comprises a carrier comprising an array of DUTs, wherein the carrier is operable to slide into the slot of the tester rack, and wherein each DUT in the array of DUTs aligns with a respective socket on the TIB. Further, the test apparatus comprises a plurality of socket covers, wherein each socket cover of the plurality of socket covers is operable to actuate a top portion of each DUT of the array of DUTs in the carrier.

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Patent Owner(s)

Patent OwnerAddress
ADVANTEST TEST SOLUTIONS INCSAN JOSE CA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Aoki, Yoshiyuki San Jose, US 40 260
Hasegawa, Kotaro San Jose, US 9 31
Kabbani, Samer San Jose, US 55 926
Kucheriya, Amit San Jose, US 8 105
Leventhal, Ira San Jose, US 22 309
Miyauchi, Koji San Jose, US 13 173
Oseguera, Gilberto San Jose, US 19 174
Ranganathan, Karthik San Jose, US 67 800
Schaub, Keith San Jose, US 13 417

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges1919101 - 100100200300400500600700800900100011001200130014001500160017001800190020002100

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