Systems and methods for improved charge pump phase-locked loop phase stability
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United States of America
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Jan 14, 2025
Grant Date -
Oct 17, 2024
app pub date -
Apr 17, 2023
filing date -
Apr 17, 2023
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Abstract
In a charge pump-based PLL circuit, charge pump output current variation may cause phase instability at an output of a VCO. The output current variation may be caused by low-frequency disturbances (e.g., tuning voltage (Vtune) drift with channel length modulation effect), disturbance in a gate bias voltage of a transistor, or a VDD transient. Such a low-frequency disturbance may occur during initial lock, which may affect phase settling time, or after lock, which may result in phase instability. A replica charge pump and a current filtering and compensation circuit may be implemented at the output of a main charge pump to provide error current compensation to suppress channel length modulation effect, improve phase stability, and reduce phase noise.
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