Dual channel gate all around transistor device and fabrication methods thereof

Number of patents in Portfolio can not be more than 2000

United States of America

PATENT NO 12198986
APP PUB NO 20230386936A1
SERIAL NO

18366562

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Abstract

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A semiconductor structure includes a fin disposed on a substrate, the fin including a channel region comprising a plurality of channels vertically stacked over one another, the channels comprising germanium distributed therein. The semiconductor structure further includes a gate stack engaging the channel region of the fin and gate spacers disposed between the gate stack and the source and drain regions of the fin, wherein each channel of the channels includes a middle section wrapped around by the gate stack and two end sections engaged by the gate spacers, wherein a concentration of germanium in the middle section of the channel is higher than a concentration of germanium in the two end sections of the channel, and wherein the middle section of the channel further includes a core portion and an outer portion surrounding the core portion with a germanium concentration profile from the core portion to the outer portion.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD8 LI-HSIN RD 6 HSINCHU SCIENCE PARK HSINCHU 300-78

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chiang, Kuo-Cheng Hsinchu County, TW 533 619
Chou, Chih-Chao Hsinchu, TW 42 121
Huang, Jui-Chien Hsinchu, TW 54 103
Lin, Chun-Hsiung Hsinchu County, TW 118 1300
Wang, Chih-Hao Hsinchu County, TW 1232 8869
Wang, Pei-Hsun Hsinchu, TW 50 141
Yun, Wei-Sheng Taipei, TW 54 186

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