Semiconductor device related to calibrating a termination resistance

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United States of America

PATENT NO 12198784
APP PUB NO 20230335168A1
SERIAL NO

18116001

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Abstract

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A semiconductor system includes a controller configured to transmit a command address and a plurality of read strobe signals, and a semiconductor device including a first rank and a second rank that are configured to receive the command address and the plurality of read strobe signals and to perform a write operation and a read operation based on the command address. In the semiconductor device, the first rank is configured to calibrate a termination resistance value of the first rank to a target resistance value when a write operation for the first rank is performed. In the semiconductor device, the first rank is configured to calibrate the termination resistance value of the first rank to a dynamic resistance value based on the plurality of read strobe signals when a write operation for the second rank is performed.

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Patent Owner(s)

Patent OwnerAddress
SK HYNIX INCGYEONGGI DO SOUTH KOREA GYEONGGI-DO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hwang, Kyu Dong Icheon-si Gyeonggi-do, KR 28 61
Kim, Saeng Hwan Icheon-si Gyeonggi-do, KR 37 164
Lim, Chae Sung Icheon-si Gyeonggi-do, KR 2 0
Song, Hong Joo Icheon-si Gyeonggi-do, KR 5 5
Yoon, Sang Sic Icheon-si Gyeonggi-do, KR 52 824
You, Jung Taek Icheon-si Gyeonggi-do, KR 12 15

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