Optical inspection circuit and optical inspection method
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United States of America
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Jan 14, 2025
Grant Date -
Jul 21, 2022
app pub date -
May 23, 2019
filing date -
May 23, 2019
priority date (Note) -
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Abstract
In an embodiment, an optical inspection circuit includes: an optical modulator comprising an optical waveguide on a substrate, the optical waveguide having a core comprising a semiconductor; a first input waveguide optically connected to the optical modulator, the first input waveguide having a core comprising the semiconductor; an output waveguide optically connected to the optical modulator, the output waveguide having a core comprising the semiconductor; a photodiode on the substrate in a vicinity of the optical modulator; a wire electrically connecting the optical modulator and the photodiode; and a second input waveguide optically connected to the photodiode, the second input waveguide having a core comprising the semiconductor.
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