Methods and apparatus for testing inaccessible interface circuits in a semiconductor device
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United States of America
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Jan 14, 2025
Grant Date -
Aug 24, 2023
app pub date -
Jan 20, 2023
filing date -
Jan 20, 2023
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Abstract
A semiconductor IC device comprises a timing circuit to transfer a timing signal, the timing circuit being configured to receive a first test signal and to effect a delay in the timing signal in response to the first test signal, the first test signal including a first timing event. The semiconductor IC device further comprises an interface circuit configured to transfer the data signal in response to the timing signal, the interface circuit being further configured to receive a second test signal and to effect a delay in the data signal in response to the second test signal, the second test signal including a second timing event that is related to the first timing event according to a test criterion.
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