Tin oxide mandrels in patterning

Number of patents in Portfolio can not be more than 2000

United States of America

PATENT NO 12183589
APP PUB NO 20210265173A1
SERIAL NO

17302847

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Abstract

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Tin oxide films are used as mandrels in semiconductor device manufacturing. In one implementation the process starts by patterning a tin oxide layer using at least one of a hydrogen-based etch chemistry and a chlorine-based etch chemistry, and using patterned photoresist as a mask, thereby providing a substrate having a plurality of protruding tin oxide features (mandrels). Next, a conformal layer of spacer material is formed both on the horizontal surfaces and on the sidewalls of the mandrels. The spacer material is then removed from the horizontal surfaces exposing the tin oxide material of the mandrels, without fully removing the spacer material residing at the sidewalls of the mandrels. Next, mandrels are selectively removed (e.g., using hydrogen-based etch chemistry), while leaving the spacer material that resided at the sidewalls of the mandrels. The resulting spacers can be used for patterning underlying layers on the substrate.

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Patent Owner(s)

Patent OwnerAddress
LAM RESEARCH CORPORATIONFREMONT CA

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Heo, Seongjun Dublin, US 12 90
Kanakasabapathy, Sivananda Krishnan Pleasanton, US 16 97
Pan, Yang Los Altos, US 310 4868
Tan, Samantha S H Fremont, US 23 240
Volosskiy, Boris San Jose, US 23 232
Wise, Richard Los Gatos, US 74 1883
Wu, Hui-Jung Pleasanton, US 55 1979
Yu, Jengyi San Ramon, US 49 1139

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