Bit error rate estimation and classification in NAND flash memory
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United States of America
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Dec 24, 2024
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Mar 17, 2023
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Mar 17, 2023
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Abstract
A method for reading data from an SSD, comprising: retrieving data from a target row of memory cells using initial threshold voltages; decoding the data using a first hard decision decoding stage; estimating a bit error rate (BER) of a target row of memory cells based on a distribution of threshold voltages of cells in a memory block containing the target row when the first hard decision decoding stage fails; classifying the BER of the target row based on a first BER threshold (BER-TH1); and executing a first read flow comprising at least one hard decision decoding stage if the BER is less than the BER-TH1, and executing a second read flow similar to the first read flow if the BER is greater than or equal to the BER-TH1, the second read flow skipping a hard decision decoding stage of the first read flow.
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