Ergonomic loading for a test interface board (TIB) / burn-in-board (BIB) in a slot-based test system
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United States of America
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Dec 24, 2024
Grant Date -
Dec 7, 2023
app pub date -
Jun 2, 2022
filing date -
Jun 2, 2022
priority date (Note) -
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Abstract
A testing apparatus includes a tester rack with a plurality of slots where at least one slot in the tester rack is a dedicated slot operable to receive a test interface board (TIB) from a back of the tester rack, where the back of the tester rack is opposite a front of a tester rack, and where the front of the tester rack faces a handler and a front-facing elevator. The apparatus also includes a handler operable to load devices under test (DUTs) onto the TIB and a front-facing elevator move the TIB from the dedicated slot to an available slot in the tester rack, wherein the available slot includes power electronics operable to connect to the TIB to test devices under test (DUT) disposed on the TIB.
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