Measuring voltage level of a voltage node utilizing a measurement integrated circuit

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United States of America

PATENT NO 12174227
APP PUB NO 20220317164A1
SERIAL NO

17653062

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Abstract

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One or more examples relate to methods and apparatuses for measuring a voltage node. An example method may include providing, between an input of a measurement circuit and a voltage node associated with a higher voltage domain than the measurement circuit, a circuit including decoupled capacitors, the decoupled capacitors including at least a first capacitor and a second capacitor; generating, by the measurement circuit, a first digital value representing a voltage level related to a voltage level at the voltage node at least partially responsive to performing a measurement process utilizing the circuit; and generating, by a processor, a second digital value representing the voltage level at the voltage node at least partially responsive to the first digital value and a scaling factor, the scaling factor representing a pre-specified relationship between the voltage level represented by the first digital value and the voltage level at the voltage node.

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Patent Owner(s)

Patent OwnerAddress
MICROCHIP TECHNOLOGY INCORPORATED2355 WEST CHANDLER BLVD CHANDLER AS 85224-6199

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Zou, Lei Langhus, NO 41 180

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