Plasma treatment apparatus, a method of monitoring a process of manufacturing a semiconductor device by using the same, and a method of manufacturing a semiconductor device including the monitoring method

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United States of America

PATENT NO 12170233
APP PUB NO 20220181219A1
SERIAL NO

17394471

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Abstract

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A plasma treatment apparatus includes a light generator that generates light, a chamber that receives the light generated from the light generator, an optical element provided between the light generator and the chamber, a light detector that detects the light reflected in the chamber, and a controller connected to the light generator and the light detector. The chamber includes an electrostatic chuck provided in a lower portion of the chamber, an edge ring provided around the electrostatic chuck, an outer wall for sealing an inner space of the chamber, and a gas supply that injects a process gas into the chamber. The optical element branches the generated light to irradiate branched light to different regions of the chamber.

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Patent Owner(s)

Patent OwnerAddress
SAMSUNG ELECTRONICS CO LTDGYEONGGI DO SOUTH KOREA GYEONGGI-DO

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kim, Sung-Yeol Yongin-si, KR 27 348
Kim, Sunghyup Hwaseong-si, KR 36 20
Lim, Meehyun Seoul, KR 10 1
Yong, Hyung-Jung Seongnam-si, KR 2 4
Yoo, Hosun Suwon-si, KR 6 2

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