Surface abnormality detection device and system
Number of patents in Portfolio can not be more than 2000
United States of America
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Nov 26, 2024
Grant Date -
May 19, 2022
app pub date -
Mar 17, 2020
filing date -
Mar 17, 2020
priority date (Note) -
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Abstract
There is provided a surface abnormality detection device, and a system, capable of detecting an abnormal portion having a displacement below the distance measurement accuracy when detecting the abnormal portion on the surface of a structure. A surface abnormality detection device includes a classification means for classifying an object under measurement into one or more clusters having the same structure, based on position information at a plurality of points on a surface of the object under measurement; a determination means for determining a reflection brightness normal value of the cluster based on a distribution of reflection brightness values at a plurality of points on a surface of the cluster; and an identification means for identifying an abnormal portion on the surface of the cluster based on a difference between the reflection brightness normal value and the reflection brightness value at each of the plurality of points.
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