Atomic-force microscopy for identification of surfaces

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United States of America

PATENT NO 12153068
APP PUB NO 20240012022A1
SERIAL NO

18370923

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Abstract

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A method comprises using an atomic-force microscope, acquiring a set of images associated with surfaces, and, using a machine-learning algorithm applied to the images, classifying the surfaces. As a particular example, the classification can be done in a way that relies on surface parameters derived from the images rather than using the images directly.

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Patent Owner(s)

Patent OwnerAddress
TRUSTEES OF TUFTS COLLEGEBALLOU HALL MEDFORD MA 02155

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Miljkovic, Milos Medford, US 9 134
Sokolov, Igor Medford, US 40 810

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