In-situ testing system for semiconductor device in aerospace irradiation environment

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United States of America

PATENT NO 12146908
SERIAL NO

18631171

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Abstract

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The present invention discloses an in-situ testing system for semiconductor device in aerospace irradiation environment. The present invention includes a static testing unit, a static testing channel, a dynamic testing unit, a dynamic testing channel, and a channel switching control unit; the static testing unit is connected to the device under test through the static testing channel, and is used to output static testing signals and display the static testing data of the device under test; the dynamic testing unit is connected to the device under test through the dynamic testing channel, and is used to output dynamic testing signals and display the dynamic testing data of the device under test; the channel switching control unit is connected to the static testing channel and the dynamic testing channel, respectively. This invention can achieve static, dynamic, and degradation testing of third-generation semiconductor device in aerospace irradiation environment.

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Patent Owner(s)

Patent OwnerAddress
NANJING UNIVERSITY210093 DEPARTMENT OF SCIENCE AND TECHNOLOGY NANJING UNIVERSITY 22 HANKOU ROAD JIANGSU NANJING NANJING CITY JIANGSU PROVINCE 210093

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lu, Hai Nanjing, CN 20 19
Ren, Fangfang Nanjing, CN 1 0
Wang, Wenfeng Nanjing, CN 35 58
Xu, Weizong Nanjing, CN 6 8
Zhou, Dong Nanjing, CN 77 1158
Zhou, Feng Nanjing, CN 368 1663

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