Testing apparatus and testing method
Number of patents in Portfolio can not be more than 2000
United States of America
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Nov 19, 2024
Grant Date -
May 12, 2022
app pub date -
Mar 4, 2019
filing date -
Mar 4, 2019
priority date (Note) -
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status (Latency Note)
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Abstract
Provided is a technique for preventing erroneous recognition of a fine particle region from a captured image of fine particles. A fine particle testing apparatus of the present disclosure includes: an imaging part capturing a first fine particle image of a well that holds a liquid containing fine particles; an image processor executing a process of generating a second fine particle image by extracting a contour of the first fine particle image, a process of performing a logical operation between the first fine particle image and the second fine particle image, a process of calculating a feature amount of the fine particles based on a result of the logical operation, and a process of determining growth of the fine particles in the well based on the calculated feature amount; and an output part outputting a result of the determination.
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