Exposure defects classification of images using a neural network
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United States of America
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Nov 12, 2024
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app pub date -
Sep 30, 2022
filing date -
Sep 30, 2022
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Abstract
Embodiments of the present invention provide systems, methods, and computer storage media for detecting and classifying an exposure defect in an image using neural networks trained via a limited amount of labeled training images. An image may be applied to a first neural network to determine whether the images includes an exposure defect. Detected defective image may be applied to a second neural network to determine an exposure defect classification for the image. The exposure defect classification can includes severe underexposure, medium underexposure, mild underexposure, mild overexposure, medium overexposure, severe overexposure, and/or the like. The image may be presented to a user along with the exposure defect classification.
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