Systems and methods for sample analysis using swabs
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United States of America Patent
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Oct 22, 2024
Grant Date -
Nov 30, 2023
app pub date -
Jun 9, 2023
filing date -
Aug 28, 2017
priority date (Note) -
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Abstract
The invention generally relates to systems and methods for sample analysis using swabs. In certain aspects, the invention provides systems that include a probe having a conductive proximal portion coupled to a porous material at a distal portion of the probe that is configured to retain a portion of a sample that has contacted the porous material, and a mass spectrometer having an inlet. The system is configured such that the porous material at a distal portion of the probe is aligned over the inlet of the mass spectrometer.
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