Fault detection in integrated circuits

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 12107556
APP PUB NO 20230100245A1
SERIAL NO

17448822

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Abstract

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An integrated circuit includes a transimpedance amplifier and an injection circuit. The injection circuit generates a first electrical test signal and injects the first electrical test signal into the transimpedance amplifier. The first electrical test signal or an output of the transimpedance amplifier generated based on the first electrical test signal is used to determine whether the integrated circuit is faulty.

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Patent Owner(s)

Patent OwnerAddress
CISCO TECHNOLOGY INC170 WEST TASMAN DRIVE SAN JOSE CA 95134

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kurylak, Alexander C Bethlehem, US 7 7
Lakshmikumar, Kadaba Basking Ridge, US 28 80
Sunder, Sanjay Allentown, US 12 15

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